Semiconductor Wire Bond Pull Strength Calculator

Audit already observed wire-bond break-load evidence separately from missing tests, no destructive testing instructions, bond geometry tensile-strength model or certification.

Description

Wire-bond pull evidence includes measured break loads and tests without usable results.

Wire-bond pull evidence includes measured break loads and tests without usable results.1

Keeping those groups separate prevents absent tests from becoming confirmed zero-strength observations.

When to use Semiconductor Wire Bond Pull Strength Calculator

Use this tool when you need to reproduce the stated calculation from measured records or independently selected model inputs. Prepare measured device or specimen records under independently matched branch, temperature, frame, and unit conventions.

How to use Semiconductor Wire Bond Pull Strength Calculator and understand its results

  1. Prepare measured device or specimen records under independently matched branch, temperature, frame, and unit conventions.
  2. Enter observedWirePullBreakLoadsN, callerBreakLoadEvidenceFlags, callerMinimumBreakLoadN, following the field table and rules below, then run the tool.
  3. Read knownWirePullMinimumN, unknownWirePullTestCount, knownPullTestsBelowCallerMinimum. Use the output meanings below to interpret units, signs, flags, and any nested result fields.
  4. Correct reported input issues and run again. For a successful result, check the stated evidence coverage and assumptions before using it in your review.
Input fieldMeaningValue typeRequirement
observedWirePullBreakLoadsNObserved wire pull break loads nlist of numberRequired
callerBreakLoadEvidenceFlagsCaller break load evidence flagslist of numberRequired
callerMinimumBreakLoadNCaller minimum break load nnumberRequired

Use aligned nonempty nonnegative loads in newtons and binary evidence flags, plus a nonnegative caller minimum. At least one known load is required. Return the smallest known load, count unknown tests, and flag known indices strictly below the criterion.

minimum=min{load_i:known_i=1}; review_i=known_i and load_i<criterion

Symbols follow the input and output meanings and the calculation rules above.

Output fieldMeaningValue type
knownWirePullMinimumNKnown wire pull minimum nnumber
unknownWirePullTestCountUnknown wire pull test countnumber
knownPullTestsBelowCallerMinimumKnown pull tests below caller minimumlist of number
json
{
  "input": {
    "observedWirePullBreakLoadsN": [
      1,
      2,
      3
    ],
    "callerBreakLoadEvidenceFlags": [
      1,
      0,
      1
    ],
    "callerMinimumBreakLoadN": 2
  },
  "output": {
    "knownWirePullMinimumN": 1,
    "unknownWirePullTestCount": 1,
    "knownPullTestsBelowCallerMinimum": [
      0
    ]
  }
}

Limitations and assumptions

Matched measurement branch, material state, calibration, and conventions must be independently established. Results do not certify device performance or operating conditions.

Missing required fields, unknown fields, wrong types, and violated calculation rules are input issues. Numeric values must be finite; nonfinite results are rejected. Evidence arrays must be dense, with no missing cells. Numeric observation lists allow at most 10,000 entries, subject to any smaller bounds stated above.

Alternative or Complementary methods

For a related review, use Semiconductor Wafer Bonding Interface Energy Calculator: An interface-energy estimate can separate observed delamination work from independently measured fixture work. Dividing that signed remainder by newly delaminated area gives an energy-per-area observation. For a complementary step, use Semiconductor Solder Joint Fatigue Life Coffin Manson Calculator: The Coffin–Manson relation here uses plastic strain amplitude and failure reversals equal to twice failure cycles. That convention introduces a half factor when solving for cycles.

References

  1. Semiconductor Wire Bond Pull Strength Calculator — tool.io

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