Semiconductor Solder Joint Fatigue Life Coffin Manson Calculator
Named Coffin–Manson plastic STRAIN AMPLITUDE=εf′(2Nf)^c, explicit reversals-versus-cycles half factor; no elastic Basquin term, life guarantee or safety qualification.
Description
The Coffin–Manson relation here uses plastic strain amplitude and failure reversals equal to twice failure cycles.
The Coffin–Manson relation here uses plastic strain amplitude and failure reversals equal to twice failure cycles.1
That convention introduces a half factor when solving for cycles.
When to use Semiconductor Solder Joint Fatigue Life Coffin Manson Calculator
Use this tool when you need to reproduce the stated calculation from measured records or independently selected model inputs. Prepare measured device or specimen records under independently matched branch, temperature, frame, and unit conventions.
How to use Semiconductor Solder Joint Fatigue Life Coffin Manson Calculator and understand its results
- Prepare measured device or specimen records under independently matched branch, temperature, frame, and unit conventions.
- Enter observedPlasticStrainAmplitudes, callerMatchedDuctilityCoefficient, callerMatchedFatigueExponent, following the field table and rules below, then run the tool.
- Read coffinMansonFailureCycles. Use the output meanings below to interpret units, signs, flags, and any nested result fields.
- Correct reported input issues and run again. For a successful result, check the stated evidence coverage and assumptions before using it in your review.
| Input field | Meaning | Value type | Requirement |
|---|---|---|---|
| observedPlasticStrainAmplitudes | Observed plastic strain amplitudes | list of number | Required |
| callerMatchedDuctilityCoefficient | Caller matched ductility coefficient | number | Required |
| callerMatchedFatigueExponent | Caller matched fatigue exponent | number | Required |
Use nonempty positive plastic strain amplitudes, a positive matched ductility coefficient, and a strictly negative matched exponent. Apply the inverse power relation and divide reversals by two. This model omits the elastic Basquin term and returns fractional cycles without rounding.
N_f=0.5(ε_plasticAmplitude/ε_f′)^(1/c) Symbols follow the input and output meanings and the calculation rules above.
| Output field | Meaning | Value type |
|---|---|---|
| coffinMansonFailureCycles | Coffin manson failure cycles | list of number |
{
"input": {
"observedPlasticStrainAmplitudes": [
0.1,
0.2
],
"callerMatchedDuctilityCoefficient": 0.5,
"callerMatchedFatigueExponent": -0.5
},
"output": {
"coffinMansonFailureCycles": [
12.499999999999998,
3.1249999999999996
]
}
}Limitations and assumptions
Matched measurement branch, material state, calibration, and conventions must be independently established. Results do not certify device performance or operating conditions.
Missing required fields, unknown fields, wrong types, and violated calculation rules are input issues. Numeric values must be finite; nonfinite results are rejected. Evidence arrays must be dense, with no missing cells. Numeric observation lists allow at most 10,000 entries, subject to any smaller bounds stated above.
Alternative or Complementary methods
For a related review, use Semiconductor Wire Bond Pull Strength Calculator: Wire-bond pull evidence includes measured break loads and tests without usable results. Keeping those groups separate prevents absent tests from becoming confirmed zero-strength observations. For a complementary step, use Semiconductor Sic Mosfet Short Circuit Withstand Time Calculator: Short-circuit withstand records can bound observed successes and failures under matched conditions. Missing outcome classes need an explicit sentinel rather than an invented duration.
References
Similar or alternative tools
- Semiconductor Wire Bond Pull Strength Calculator
Wire-bond pull evidence includes measured break loads and tests without usable results. Keeping those groups separate prevents absent tests from becoming confirmed zero-strength observations.
- Semiconductor Sic Mosfet Short Circuit Withstand Time Calculator
Short-circuit withstand records can bound observed successes and failures under matched conditions. Missing outcome classes need an explicit sentinel rather than an invented duration.