Use this semiconductor calculation for first-order device, material, fabrication, interconnect, packaging, or reliability estimates when every coefficient and unit convention is known.

Channel length (nm)

Required number in nm. Actual channel length.

Minimum channel length (nm)

Required number in nm. Technology minimum channel length.

Roll-off coefficient (mV)

Required number in mV. Roll-off coefficient in millivolts.

The cited overview of Semiconductor device supplies background for the terminology and domain context used by this tool.^[1]

Estimate the negative threshold-voltage shift caused by short-channel roll-off relative to the minimum channel length. Inputs are interpreted exactly in the displayed units and the calculation returns the following fields without presentation rounding.

Threshold shift (mV)

Returned number in mV. Negative threshold-voltage shift in millivolts.

• Material composition, geometry, process history, temperature, electric field, bias, interfaces, parasitics, and fitted parameter ranges can invalidate a compact semiconductor model.
• Channel length must be at least 0.
• Minimum channel length must be at least 0.
• Use finite inputs in the displayed units, preserve source measurements and assumptions, and independently verify consequential decisions.

Compare the estimate with measured process data, current device documentation, and a higher-fidelity circuit, field, thermal, quantum, or TCAD model when the decision requires it.

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