Stress Migration Rate Calculator
Estimate stress migration void growth rate in interconnects from the tensile stress.
Description
Estimate stress migration void growth rate in interconnects from the tensile stress.
Stress Migration Rate Calculator is a focused tool for the following task. Estimate stress migration void growth rate in interconnects from the tensile stress. It reports Void growth rate from the values you provide rather than inventing measurements, coefficients, or professional judgment that are not part of the input.
When to use Stress Migration Rate
Use this semiconductor calculation for first-order device, material, fabrication, interconnect, packaging, or reliability estimates when every coefficient and unit convention is known.
- Tensile stress (MPa)
- Required number in MPa. Tensile stress driving void growth in the metal line.
- Migration rate coefficient (nm/h/MPa)
- Required number in nm/h/MPa. Void growth rate per unit tensile stress for the metallization.
The cited overview of Semiconductor device supplies background for the terminology and domain context used by this tool.1
How Stress Migration Rate works
Estimate stress migration void growth rate in interconnects from the tensile stress. Inputs are interpreted exactly in the displayed units and the calculation returns the following fields without presentation rounding.
- Void growth rate (nm/h)
- Returned number in nm/h.
Limitations and assumptions
- Material composition, geometry, process history, temperature, electric field, bias, interfaces, parasitics, and fitted parameter ranges can invalidate a compact semiconductor model.
- Tensile stress must be at least 0.
- Migration rate coefficient must be at least 0.
- Use finite inputs in the displayed units, preserve source measurements and assumptions, and independently verify consequential decisions.
Alternative or Complementary approaches
Compare the estimate with measured process data, current device documentation, and a higher-fidelity circuit, field, thermal, quantum, or TCAD model when the decision requires it.
References
-
Semiconductor device — Wikipedia contributors
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