Use this semiconductor calculation for first-order device, material, fabrication, interconnect, packaging, or reliability estimates when every coefficient and unit convention is known.

Barrier height (eV)

Required number in eV. Barrier energy above the incident particle energy.

Barrier width (nm)

Required number in nm. Physical thickness of the barrier.

Effective mass ratio

Optional number. Particle effective mass divided by the free-electron mass.

The cited overview of Quantum tunnelling supplies background for the terminology and domain context used by this tool.^[1]

Estimate transmission through a rectangular barrier with the WKB approximation from the barrier energy above the particle, width, and effective mass. Inputs are interpreted exactly in the displayed units and the calculation returns the following fields without presentation rounding.

Transmission probability

Returned number. Approximate transmission probability.

• Material composition, geometry, process history, temperature, electric field, bias, interfaces, parasitics, and fitted parameter ranges can invalidate a compact semiconductor model.
• Use finite inputs in the displayed units, preserve source measurements and assumptions, and independently verify consequential decisions.

Compare the estimate with measured process data, current device documentation, and a higher-fidelity circuit, field, thermal, quantum, or TCAD model when the decision requires it.

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