Semiconductor PCM Retention Time Calculator
Summarize actual PCM retention failure times separately from right-censored test durations; not treating still-retained samples as failures or universal Arrhenius lifetime prediction.
Description
Retention tests contain observed failures and samples still retaining state when observation ends.
Retention tests contain observed failures and samples still retaining state when observation ends.1
Those unfinished tests provide lower bounds on retention time rather than failure times.
When to use Semiconductor PCM Retention Time Calculator
Use this tool when you need to calculate the stated measurement summary or conditional model from matched observations. Prepare independently matched device or specimen measurements, units, branch selection, and model or calibration conventions.
How to use Semiconductor PCM Retention Time Calculator and understand its results
- Prepare independently matched device or specimen measurements, units, branch selection, and model or calibration conventions.
- Enter observedPcmRetentionSeconds, retentionFailureObservedFlags, following the field table and calculation rules below, then run the tool.
- Read observedFailedRetentionSeconds, rightCensoredRetentionLowerBoundsSeconds, minimumObservedFailureRetentionSeconds. Use the output table and calculation rules below to interpret units, signs, crossings, and flags.
- Correct any input issues and run again. Before using a successful result, review its units, signs, evidence coverage, and stated model or reference assumptions.
| Input field | Meaning | Value type | Requirement |
|---|---|---|---|
| observedPcmRetentionSeconds | Observed PCM retention seconds | list of number | Required |
| retentionFailureObservedFlags | Retention failure observed flags | list of number | Required |
Use nonempty aligned positive durations and binary failure flags. Separate flag-one failures from flag-zero right-censored durations, and take the minimum failure time. Reject a dataset without any observed failure; censored values never enter that minimum.
failureMinimum=min(times where failureFlag=1) Read these symbols with the field meanings and branch or reference rules above.
| Output field | Meaning | Value type |
|---|---|---|
| observedFailedRetentionSeconds | Observed failed retention seconds | list of number |
| rightCensoredRetentionLowerBoundsSeconds | Right censored retention lower bounds seconds | list of number |
| minimumObservedFailureRetentionSeconds | Minimum observed failure retention seconds | number |
{
"input": {
"observedPcmRetentionSeconds": [
100,
200,
50
],
"retentionFailureObservedFlags": [
1,
0,
1
]
},
"output": {
"observedFailedRetentionSeconds": [
100,
50
],
"rightCensoredRetentionLowerBoundsSeconds": [
200
],
"minimumObservedFailureRetentionSeconds": 50
}
}Limitations and assumptions
Measurements, branch identification, units, and model applicability must be independently established. Results do not supply universal material constants, a complete physical model, or operating-condition approval.
Missing required fields, unknown fields, wrong types, and violated calculation rules return input issues. Numeric values must be finite; nonfinite numeric outputs are rejected. Arrays must be dense, with no missing cells. Numeric lists allow at most 10000 entries, subject to smaller tool-specific bounds above.
Alternative or Complementary methods
For a related task, use Semiconductor Csp Board Level Reliability Calculator: Reliability tests distinguish observed failures from unfinished observations at a mission horizon. A right-censored test ending early does not demonstrate survival through that horizon. For a complementary step, use Semiconductor PCM Crystallization Temperature Calculator: PCM crystallization scans track a response across a measured temperature branch. An explicitly chosen response criterion defines crossing temperatures and may produce multiple candidates or none.
References
Similar or alternative tools
- Semiconductor Csp Board Level Reliability Calculator
Reliability tests distinguish observed failures from unfinished observations at a mission horizon. A right-censored test ending early does not demonstrate survival through that horizon.
- Semiconductor PCM Crystallization Temperature Calculator
PCM crystallization scans track a response across a measured temperature branch. An explicitly chosen response criterion defines crossing temperatures and may produce multiple candidates or none.