Op-Amp Open-Loop Gain
Calculate open-loop voltage gain A=Vout/(V+−V−) from an unsaturated operating-point measurement. Differential input cannot be zero; this scalar does not capture frequency-dependent gain.
Description
Calculate open-loop voltage gain A=Vout/(V+−V−) from an unsaturated operating-point measurement. Differential input cannot be zero; this scalar does not capture frequency-dependent gain.
Op-Amp Open-Loop Gain: Calculate open-loop voltage gain A=Vout/(V+−V−) from an unsaturated operating-point measurement. Differential input cannot be zero; this scalar does not capture frequency-dependent gain.
When to use Op-Amp Open-Loop Gain
Use this electronics calculation for a first-pass component, converter, signal, motor, or sensor estimate when the stated operating conditions and units match the device data.
- Output voltage (V)
- Required number input.
- Differential input voltage (V)
- Required number input.
How Op-Amp Open-Loop Gain works
Calculate open-loop voltage gain A=Vout/(V+−V−) from an unsaturated operating-point measurement. Differential input cannot be zero; this scalar does not capture frequency-dependent gain. The tool evaluates the supplied inputs together and returns the named outputs below; it does not infer omitted operating conditions or change the units shown.1
- Open Loop Gain
- The resulting open loop gain returned as a number.
Limitations and assumptions
- Compact electronics formulas omit some combination of tolerances, temperature drift, bandwidth, loading, parasitics, noise spectrum, nonlinearity, clipping, calibration, layout, and device-specific limits. Typical datasheet values are not guaranteed limits.
- Use finite inputs in the displayed units and preserve more precision than the final presentation requires. Independently verify safety-critical, financial, compliance, or production decisions.
Alternative or Complementary approaches
Check the result against the current datasheet and worst-case operating corners, then verify the circuit or measurement with simulation and bench testing where failure matters.
References
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Electronics — Wikipedia contributors
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