Use this semiconductor calculation for first-order device, material, fabrication, interconnect, packaging, or reliability estimates when every coefficient and unit convention is known.

Seebeck Volts Per Kelvin (V/K)

Required number in V/K.

Electrical Siemens Per Meter (S/m)

Required number in S/m.

Temperature Kelvin (K)

Required number in K.

Thermal Watts Per Meter Kelvin (W/(m·K))

Required number in W/(m·K).

The cited overview of Semiconductor device supplies background for the terminology and domain context used by this tool.^[1]

Dimensionless thermoelectric figure of merit ZT=S²σT/κ using SI Seebeck coefficient, conductivity and thermal conductivity. Inputs are interpreted exactly in the displayed units and the calculation returns the following fields without presentation rounding.

Zt

Returned number.

• Material composition, geometry, process history, temperature, electric field, bias, interfaces, parasitics, and fitted parameter ranges can invalidate a compact semiconductor model.
• Electrical Siemens Per Meter must be at least 0.
• Temperature Kelvin must be at least 0.
• Thermal Watts Per Meter Kelvin must be at least 0.
• Use finite inputs in the displayed units, preserve source measurements and assumptions, and independently verify consequential decisions.

Compare the estimate with measured process data, current device documentation, and a higher-fidelity circuit, field, thermal, quantum, or TCAD model when the decision requires it.

• Thermoelectric Power Factor

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• Thermoelectric Seebeck Coefficient

  Seebeck coefficient from open-circuit voltage change and temperature difference using S=−ΔV/ΔT for the selected polarity convention.

• InP Lattice Constant Calculator

  Compute the InP lattice constant at a temperature using the 25 degrees Celsius reference value 5.869 angstrom and a documented thermal expansion coefficient of 4.56e-6 per kelvin.