Semiconductor Metamaterial Negative Index Condition Calculator

Screen actual ε/μ signs only on caller verified low-loss isotropic branch, double-negative candidate not a causality/passivity or full complex negative-index certification.

Description

Sign screens for real permittivity and permeability are useful within a verified low-loss isotropic branch.

Sign screens for real permittivity and permeability are useful within a verified low-loss isotropic branch.1

Their outcomes are candidates under that assumption rather than a full complex-index or passivity analysis.

When to use Semiconductor Metamaterial Negative Index Condition Calculator

Use this tool when you need to calculate the stated measurement summary or conditional model from matched observations. Prepare independently matched device or specimen measurements, units, branch selection, and model or calibration conventions.

How to use Semiconductor Metamaterial Negative Index Condition Calculator and understand its results

  1. Prepare independently matched device or specimen measurements, units, branch selection, and model or calibration conventions.
  2. Enter observedRealRelativePermittivity, observedRealRelativePermeability, callerLowLossIsotropicBranchVerified, following the field table and calculation rules below, then run the tool.
  3. Read doubleNegativeCandidateFlags, singleNegativeEvanescentCandidateFlags. Use the output table and calculation rules below to interpret units, signs, crossings, and flags.
  4. Correct any input issues and run again. Before using a successful result, review its units, signs, evidence coverage, and stated model or reference assumptions.
Input fieldMeaningValue typeRequirement
observedRealRelativePermittivityObserved real relative permittivitylist of numberRequired
observedRealRelativePermeabilityObserved real relative permeabilitylist of numberRequired
callerLowLossIsotropicBranchVerifiedCaller low loss isotropic branch verifiedbooleanRequired

Require nonempty aligned finite real-permittivity and real-permeability lists and a true branch-verification flag. Mark both-negative pairs as double-negative candidates, and opposite-sign products as single-negative candidates. Zero products satisfy neither category.

doubleNegative=(ε<0 and μ<0); singleNegative=(ε×μ<0)

Read these symbols with the field meanings and branch or reference rules above.

Output fieldMeaningValue type
doubleNegativeCandidateFlagsDouble negative candidate flagslist of number
singleNegativeEvanescentCandidateFlagsSingle negative evanescent candidate flagslist of number
json
{
  "input": {
    "observedRealRelativePermittivity": [
      -2,
      2,
      -2
    ],
    "observedRealRelativePermeability": [
      -3,
      -3,
      3
    ],
    "callerLowLossIsotropicBranchVerified": true
  },
  "output": {
    "doubleNegativeCandidateFlags": [
      1,
      0,
      0
    ],
    "singleNegativeEvanescentCandidateFlags": [
      0,
      1,
      1
    ]
  }
}

Limitations and assumptions

Measurements, branch identification, units, and model applicability must be independently established. Results do not supply universal material constants, a complete physical model, or operating-condition approval.

Missing required fields, unknown fields, wrong types, and violated calculation rules return input issues. Numeric values must be finite; nonfinite numeric outputs are rejected. Arrays must be dense, with no missing cells. Numeric lists allow at most 10000 entries, subject to smaller tool-specific bounds above.

Alternative or Complementary methods

For a related task, use Semiconductor Phase Change Material Refractive Index Contrast Calculator: A phase-change material has complex optical indices whose real and imaginary parts describe different optical behavior. Comparing matched amorphous and crystalline measurements preserves both components of the contrast. For a complementary step, use Semiconductor Glass Interposer Loss Tangent Calculator: Dielectric loss tangent is a ratio between loss and real permittivity under a stated complex-sign convention. Matched glass-interposer measurements supply that ratio for each sampled condition.

References

  1. Semiconductor Metamaterial Negative Index Condition Calculator — tool.io

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