Semiconductor Light Extraction Cone Angle Calculator
Ideal planar-interface total-internal-reflection escape-cone HALFangle arcsin(nout/nin); actual isotropic positive indices independently verified. Not Fresnel transmission, total LEDextraction efficiency or nanostructure scattering.
Description
A critical escape-cone angle follows a declared refractive-index interface model.
A critical escape-cone angle follows a declared refractive-index interface model.1
The selected total-internal-reflection branch requires the outside index not to exceed the inside index.
When to use Semiconductor Light Extraction Cone Angle Calculator
Use this tool to obtain conditionalCriticalConeHalfAngleDegrees from the supplied records using the stated calculation. Establish the device or material, operating point, units and independently applicable measurement or model calibration.
How to use Semiconductor Light Extraction Cone Angle Calculator and understand its results
- Establish the device or material, operating point, units and independently applicable measurement or model calibration.
- Enter verifiedEmissionMediumRefractiveIndex, verifiedEscapeMediumRefractiveIndex, using the field meanings and rules below, then run the tool.
- Read result.conditionalCriticalConeHalfAngleDegrees. Use the units and sign conventions below, and review any unknown records separately.
- Correct any reported input issue and run again. Before using a successful result, check the stated units, signs, reference scope and observation coverage.
| Input field | Meaning | Value type | Requirement |
|---|---|---|---|
| verifiedEmissionMediumRefractiveIndex | Verified emission medium refractive index | number | Required |
| verifiedEscapeMediumRefractiveIndex | Verified escape medium refractive index | number | Required |
Require positive emission-medium and escape-medium refractive indices, with outside≤inside. Return arcsine(outside/inside) converted to degrees as the critical half-angle. Equality returns ninety degrees; the opposite-index branch fails. No Fresnel transmission or integrated extraction fraction is calculated.
criticalHalfAngleDegrees=(180/pi)×asin(outsideIndex/insideIndex) Use the matching field units and the exact boundary, ordering and reference rules above.
| Output field | Meaning | Value type |
|---|---|---|
| result | Qualified observed calculation or explicit reference | object |
| result.conditionalCriticalConeHalfAngleDegrees | Arcsine(outside/inside index) converted to degrees on the declared TIR branch. | number |
{
"input": {
"verifiedEmissionMediumRefractiveIndex": 2,
"verifiedEscapeMediumRefractiveIndex": 1
},
"output": {
"result": {
"conditionalCriticalConeHalfAngleDegrees": 30.000000000000004
}
}
}Limitations and assumptions
Device structure, material state, operating conditions and calibration determine applicability. The result does not infer missing physical parameters, verify a transport mechanism or validate a fabricated device model.
Missing required fields, unknown fields, wrong types and violated rules return input issues. Numeric values and outputs must be finite. Extremely large composite outputs are rejected.
Alternative or Complementary methods
For a related step, use Semiconductor Photon Recycling Factor Calculator: A geometric photon-recycling model repeats radiative re-emission and reabsorption. For a complementary comparison, use Semiconductor Radiative Recombination Coefficient Bimolecular Calculator: A bimolecular radiative coefficient relates separated radiative rate to a net electron-hole density product.
References
Similar or alternative tools
- Semiconductor Photon Recycling Factor Calculator
A geometric photon-recycling model repeats radiative re-emission and reabsorption.
- Semiconductor Radiative Recombination Coefficient Bimolecular Calculator
A bimolecular radiative coefficient relates separated radiative rate to a net electron-hole density product.