GaAs/AlAs Band Offset Calculator

Partition a GaAs/AlAs bandgap difference into conduction- and valence-band offsets using a supplied empirical offset fraction.

Description

Partition a GaAs/AlAs bandgap difference into conduction- and valence-band offsets using a supplied empirical offset fraction.

GaAs/AlAs Band Offset Calculator is a focused tool for the following task. Partition a GaAs/AlAs bandgap difference into conduction- and valence-band offsets using a supplied empirical offset fraction. It reports Conduction band offset, Valence band offset from the values you provide rather than inventing measurements, coefficients, or professional judgment that are not part of the input.

When to use GaAs/AlAs Band Offset

Use this semiconductor calculation for first-order device, material, fabrication, interconnect, packaging, or reliability estimates when every coefficient and unit convention is known.

Band gap difference (eV)
Required number in eV.
Conduction-band offset fraction
Optional number. Empirical fraction of the bandgap difference assigned to the conduction-band offset.

The cited overview of Band gap supplies background for the terminology and domain context used by this tool.1

How GaAs/AlAs Band Offset works

Partition a GaAs/AlAs bandgap difference into conduction- and valence-band offsets using a supplied empirical offset fraction. Inputs are interpreted exactly in the displayed units and the calculation returns the following fields without presentation rounding.

Conduction band offset (eV)
Returned number in eV.
Valence band offset (eV)
Returned number in eV.

Limitations and assumptions

  • Material composition, geometry, process history, temperature, electric field, bias, interfaces, parasitics, and fitted parameter ranges can invalidate a compact semiconductor model.
  • Band gap difference must be at least 5e-324.
  • Conduction-band offset fraction must be at least 5e-324.
  • Conduction-band offset fraction must be no greater than 0.9999999999999998.
  • Use finite inputs in the displayed units, preserve source measurements and assumptions, and independently verify consequential decisions.

Alternative or Complementary approaches

Compare the estimate with measured process data, current device documentation, and a higher-fidelity circuit, field, thermal, quantum, or TCAD model when the decision requires it.

References

  1. Band gap — Wikipedia contributors

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