Description
Include edge in count only when edgeIncluded is true.
Counts per field or area depend on the sampled denominator and any overlap or edge policy. Scaling a sampled density assumes the counted region represents the target region.
Include edge in count only when edgeIncluded is true.
When to use this tool
Use Benign Colony Edge Count Policy when you need a transparent field, grid, or area-normalized count.
How to use the tool and how it works
- Enter interior, edge, edgeIncluded, usableArea. Use the units and conventions below.
- Run the tool. Correct any format, range, or cross-field input error before interpreting the output.
- Read count, countPerArea. Use the output convention below.
Include edge in count only when edgeIncluded is true. Divide the resulting count by positive usableArea.1
| Input field | Meaning and units | Accepted input |
|---|---|---|
| interior | Interior | Required. Safe integer; minimum 0. |
| edge | Edge | Required. Safe integer; minimum 0. |
| edgeIncluded | Edge Included | Required. Boolean. |
| usableArea | Usable Area | Required. Finite number; strictly above 0. |
| Output field | Interpretation | Returned shape |
|---|---|---|
| count | Count | Required. Safe integer. |
| countPerArea | Count Per Area | Required. Finite number. |
{
"input": {
"interior": 20,
"edge": 4,
"edgeIncluded": true,
"usableArea": 2
},
"output": {
"count": 24,
"countPerArea": 12
}
}Limitations and assumptions
- The caller chooses the edge policy; objects, overlapping detections, and area validity are not assessed.
- Inputs must satisfy both the field types and the cross-field conditions above. Invalid input causes an error; a successful false flag or documented placeholder is a different result.
- Numeric calculations use binary floating point unless exact decimal-integer arithmetic is explicitly stated. No hidden measurement tolerance or decimal rounding is added; nonfinite or out-of-contract results are rejected. Numeric signed-zero results are exported as zero.
Alternative or Complementary methods
Use the original images and a documented sampling and counting protocol, with uncertainty analysis where needed.
References
Similar or alternative tools
- Microscopy Field Overlap Count Adjustment
Subtract matchedOverlapCount from the two counts and overlapArea from the two areas.
- Microscope Field Count Factor
Divide nonnegative count by positive countedFields and multiply by nonnegative targetFields.