SIM Resolution Improvement
Estimate structured-illumination resolution from a measured widefield baseline and improvement factor.
Description
SIM resolution comparison divides a supplied widefield resolution by a chosen improvement factor.
SIM resolution comparison divides a supplied widefield resolution by a chosen improvement factor. A factor below one describes worsening.1
Estimate structured-illumination resolution from a measured widefield baseline and improvement factor.
When to use SIM Resolution Improvement
Use this tool to estimate structured-illumination resolution from a measured widefield baseline and improvement factor.
Prepare the optical measurements, geometry, fitted coefficients or caller-selected thresholds requested. Confirm wavelength, radius/diameter, pulse-width, angle and unit conventions before running the calculation.
How to use SIM Resolution Improvement and understand its results
- Prepare the optical measurements, geometry, fitted coefficients or caller-selected thresholds requested. Confirm wavelength, radius/diameter, pulse-width, angle and unit conventions before running the calculation.
- Enter widefieldResolutionNanometers, simImprovementFactor using the field table and calculation rules, then run the tool.
- Read simResolutionNanometers, resolutionImprovementPercent. The explanation below defines the units, signs, ordering and any flags or placeholder values.
- If the tool reports an input issue, correct the values and run it again. Apply the stated assumptions when interpreting a successfully returned result.
| Input field | Meaning | Value type; see rules below | Requirement |
|---|---|---|---|
| widefieldResolutionNanometers | Widefield resolution (nm) | number; minimum: 0 | Required |
| simImprovementFactor | SIM improvement factor | number; minimum: 0 | Required |
Enter nonnegative baseline resolution and positive factor. Return resolution and signed percentage improvement.
resolution=baseline/factor; improvement%=100(1−1/factor) Units, indexing, boundary conditions and exceptional cases are defined in the calculation rules above.
| Output field | Meaning | Value type |
|---|---|---|
| simResolutionNanometers | Estimated SIM resolution (nm) | number; minimum: 0 |
| resolutionImprovementPercent | Resolution improvement (%) | number |
{
"input": {
"widefieldResolutionNanometers": 250,
"simImprovementFactor": 2
},
"output": {
"simResolutionNanometers": 125,
"resolutionImprovementPercent": 50
}
}Limitations and assumptions
No illumination pattern, reconstruction, aberration or photon-budget model is supplied.
Numeric inputs must be finite. Follow the calculation-specific rules for overflow, underflow and exceptional cases. Missing required fields, extra fields, wrong value types and violations of the calculation rules are input errors.
Alternative or Complementary methods
Use STED Resolution: Estimate idealized STED resolution from depletion and saturation intensities. For a complementary task, use Confocal Lateral Resolution: Estimate confocal lateral FWHM and a simple finite-pinhole adjustment.
References
-
SIM Resolution Improvement — tool.io
Similar or alternative tools
- STED Resolution
Estimate idealized STED resolution from depletion and saturation intensities.
- Confocal Lateral Resolution
Estimate confocal lateral FWHM and a simple finite-pinhole adjustment.