Die Cost From Wafer Calculator
Divide the wafer cost by the good dies per wafer to obtain the cost per good die. Formula: C_good [EUR] = C_wafer [EUR] / (N_gross · Y [%]/100), where N_gross is gross dies per wafer and Y is the die yield. Inputs: C_wafer > 0 EUR, N_gross ≥ 1 integer, and 0 < Y ≤ 100 %. Output: C_good > 0 EUR. Assumes uniform yield and that wafer cost amortizes only over good dies.
Description
Calculate wafer-cost allocation per electrically good die from wafer cost, gross die count, and die yield.
Divide the wafer cost by the good dies per wafer to obtain the cost per good die. Formula: C_good [EUR] = C_wafer [EUR] / (N_gross · Y [%]/100), where N_gross is gross dies per wafer and Y is the die yield. Inputs: C_wafer > 0 EUR, N_gross ≥ 1 integer, and 0 < Y ≤ 100 %. Output: C_good > 0 EUR. Assumes uniform yield and that wafer cost amortizes only over good dies.
When to use Die Cost From Wafer Calculator
- Calculate wafer-cost allocation per electrically good die from wafer cost, gross die count, and die yield.
- Compare fabrication or device scenarios while holding coefficients and unit conventions constant.
- Check a hand calculation before moving to a higher-fidelity process, circuit, or TCAD model.
How the calculation works
Expected good dies can be fractional; this is a long-run allocation, not the realized cost of one individual wafer.
cost/good die = wafer cost / (gross dies · yield fraction) Interpreting the result
Expected good dies can be fractional; this is a long-run allocation, not the realized cost of one individual wafer.
Assumptions and limitations
- Packaging, probe, mask amortization, edge exclusions already absent from gross die count, binning, and yield uncertainty are omitted.
- Use parameters measured for the same material, geometry, temperature, and operating regime whenever the result informs engineering work.