3D-IC Thermal Coupling Calculator
Estimate the lower-tier temperature rise in a stacked 3D-IC from upper-tier power, a thermal coupling factor, and lower-tier thermal resistance. Temperature rise = power × couplingFactor × thermalResistance.
Description
Estimate the lower-tier temperature rise in a stacked 3D-IC from upper-tier power, a thermal coupling factor, and lower-tier thermal resistance. Temperature rise = power × couplingFactor × thermalResistance.
3D-IC Thermal Coupling Calculator is a focused tool for the following task. Estimate the lower-tier temperature rise in a stacked 3D-IC from upper-tier power, a thermal coupling factor, and lower-tier thermal resistance. Temperature rise = power × couplingFactor × thermalResistance. It reports Temperature rise from the values you provide rather than inventing measurements, coefficients, or professional judgment that are not part of the input.
When to use 3D-IC Thermal Coupling
Use this semiconductor calculation for first-order device, material, fabrication, interconnect, packaging, or reliability estimates when every coefficient and unit convention is known.
- Coupling factor
- Optional number. Fraction of the upper-tier thermal load that couples to the lower tier. Must be between 0 and 1; 0 yields 0 °C rise.
- Lower-tier thermal resistance (°C/W)
- Required number in °C/W. Lower-tier thermal resistance from junction to ambient. Must be greater than 0 °C/W.
- Upper-tier power (W)
- Required number in W. Total power dissipated by the upper tier. Must be at least 0 W; 0 yields 0 °C rise.
The cited overview of Semiconductor device supplies background for the terminology and domain context used by this tool.1
How 3D-IC Thermal Coupling works
Estimate the lower-tier temperature rise in a stacked 3D-IC from upper-tier power, a thermal coupling factor, and lower-tier thermal resistance. Temperature rise = power × couplingFactor × thermalResistance. Inputs are interpreted exactly in the displayed units and the calculation returns the following fields without presentation rounding.
- Temperature rise (°C)
- Returned number in °C. Estimated lower-tier temperature rise above ambient, at least 0 °C.
Limitations and assumptions
- Material composition, geometry, process history, temperature, electric field, bias, interfaces, parasitics, and fitted parameter ranges can invalidate a compact semiconductor model.
- Coupling factor must be at least 0.
- Coupling factor must be no greater than 1.
- Lower-tier thermal resistance must be at least 5e-324.
- Upper-tier power must be at least 0.
- Use finite inputs in the displayed units, preserve source measurements and assumptions, and independently verify consequential decisions.
Alternative or Complementary approaches
Compare the estimate with measured process data, current device documentation, and a higher-fidelity circuit, field, thermal, quantum, or TCAD model when the decision requires it.
References
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Semiconductor device — Wikipedia contributors
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